Determinants of International Patent Examination Outcomes
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Cited by:
- Nicolas van Zeebroeck & Bruno van Pottelsberghe de la Potterie, 2011.
"The vulnerability of patent value determinants,"
Economics of Innovation and New Technology, Taylor & Francis Journals, vol. 20(3), pages 283-308.
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- Nicolas van Zeebroeck, 2011.
"The puzzle of patent value indicators,"
Economics of Innovation and New Technology, Taylor & Francis Journals, vol. 20(1), pages 33-62.
- Nicolas van Zeebroeck, 2007. "The puzzle of patent value indicators," Working Papers CEB 07-023.RS, ULB -- Universite Libre de Bruxelles.
- Nicolas van Zeebroeck, 2011. "The Puzzle of Patent Value Indicators," ULB Institutional Repository 2013/60729, ULB -- Universite Libre de Bruxelles.
- Nicolas van Zeebroeck, 2007. "Patents only live twice: a patent survival analysis in Europe," Working Papers CEB 07-028.RS, ULB -- Universite Libre de Bruxelles.
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This paper has been announced in the following NEP Reports:- NEP-INO-2005-06-05 (Innovation)
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