IDEAS home Printed from https://ideas.repec.org/b/spr/ssreng/978-1-4471-5028-2.html
   My bibliography  Save this book

Stochastic Modeling for Reliability

Author

Listed:
  • Maxim Finkelstein

    (University of the Free State)

  • Ji Hwan Cha

    (Ewha Womans University)

Abstract

No abstract is available for this item.

Individual chapters are listed in the "Chapters" tab

Suggested Citation

  • Maxim Finkelstein & Ji Hwan Cha, 2013. "Stochastic Modeling for Reliability," Springer Series in Reliability Engineering, Springer, edition 127, number 978-1-4471-5028-2, July.
    • Handle: RePEc:spr:ssreng:978-1-4471-5028-2
    DOI: 10.1007/978-1-4471-5028-2
    as

    Download full text from publisher

    To our knowledge, this item is not available for download. To find whether it is available, there are three options:
    1. Check below whether another version of this item is available online.
    2. Check on the provider's web page whether it is in fact available.
    3. Perform a search for a similarly titled item that would be available.

    Citations

    Citations are extracted by the CitEc Project, subscribe to its RSS feed for this item.
    as


    Cited by:

    1. F. G. Badía & C. Sangüesa, 2017. "Log-Convexity of Counting Processes Evaluated at a Random end of Observation Time with Applications to Queueing Models," Methodology and Computing in Applied Probability, Springer, vol. 19(2), pages 647-664, June.
    2. Cheung, Eric C.K. & Rabehasaina, Landy & Woo, Jae-Kyung & Xu, Ran, 2019. "Asymptotic correlation structure of discounted Incurred But Not Reported claims under fractional Poisson arrival process," European Journal of Operational Research, Elsevier, vol. 276(2), pages 582-601.
    3. Ducros, Florence & Pamphile, Patrick, 2018. "Bayesian estimation of Weibull mixture in heavily censored data setting," Reliability Engineering and System Safety, Elsevier, vol. 180(C), pages 453-462.
    4. Ye, Zhenggeng & Yang, Hui & Cai, Zhiqiang & Si, Shubin & Zhou, Fuli, 2021. "Performance evaluation of serial-parallel manufacturing systems based on the impact of heterogeneous feedstocks on machine degradation," Reliability Engineering and System Safety, Elsevier, vol. 207(C).
    5. Safaei, Fatemeh & Taghipour, Sharareh, 2024. "Integrated degradation-based burn-in and maintenance model for heterogeneous and highly reliable items," Reliability Engineering and System Safety, Elsevier, vol. 244(C).

    Book Chapters

    The following chapters of this book are listed in IDEAS

    More about this item

    Statistics

    Access and download statistics

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:spr:ssreng:978-1-4471-5028-2. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Sonal Shukla or Springer Nature Abstracting and Indexing (email available below). General contact details of provider: http://www.springer.com .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.