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A mixed control chart adapted to the truncated life test based on the Weibull distribution

Author

Listed:
  • Nasrullah Khan
  • Muhammad Aslam
  • Kyung-Jun Kim
  • Chi-Hyuck Jun

Abstract

The design of a new mixed attribute control chart adapted to a truncated life test has been presented. It was assumed that the lifetime of a product follows the Weibull distribution and the number of failures was observed using a truncated life test, where the test duration was specified as a fraction of the mean lifespan. The proposed control chart consists of two pairs of control limits based on a binomial distribution and one lower bound. The average run length of the chart was determined for various levels of shift constants and specified parameters. The efficiency of the chart is compared with an existing control chart in terms of the average run length. The application of the proposed chart is discussed with the aid of a simulation study.

Suggested Citation

  • Nasrullah Khan & Muhammad Aslam & Kyung-Jun Kim & Chi-Hyuck Jun, 2017. "A mixed control chart adapted to the truncated life test based on the Weibull distribution," Operations Research and Decisions, Wroclaw University of Science and Technology, Faculty of Management, vol. 27(1), pages 43-55.
  • Handle: RePEc:wut:journl:v:1:y:2017:p:43-55:id:1291
    DOI: 10.5277/ord170103
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    References listed on IDEAS

    as
    1. Wang, Hsiuying, 2009. "Comparison of p control charts for low defective rate," Computational Statistics & Data Analysis, Elsevier, vol. 53(12), pages 4210-4220, October.
    2. Muhammad Aslam & Muhammad Azam & Nasrullah Khan & Chi-Hyuck Jun, 2015. "A mixed control chart to monitor the process," International Journal of Production Research, Taylor & Francis Journals, vol. 53(15), pages 4684-4693, August.
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    Cited by:

    1. S. Balamurali & P. Jeyadurga, 2019. "Economic design of an attribute control chart for monitoring mean life based on multiple deferred state sampling," Applied Stochastic Models in Business and Industry, John Wiley & Sons, vol. 35(3), pages 893-907, May.

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