Evaluating methods for the reliability of a large 2‐dimensional rectangular k‐within‐consecutive‐(r, s)‐out‐of‐(m, n):F system
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DOI: 10.1002/nav.20067
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References listed on IDEAS
- James Fu & Markos Koutras, 1994. "Poisson approximations for 2-dimensional patterns," Annals of the Institute of Statistical Mathematics, Springer;The Institute of Statistical Mathematics, vol. 46(1), pages 179-192, March.
- Michael V. Boutsikas & Markos V. Koutras, 2000. "Reliability Approximation for Markov Chain Imbeddable Systems," Methodology and Computing in Applied Probability, Springer, vol. 2(4), pages 393-411, December.
- Anant P. Godbole & Laura K. Potter & Jessica K. Sklar, 1998. "Improved upper bounds for the reliability of d‐dimensional consecutive‐k‐out‐of‐n : F systems," Naval Research Logistics (NRL), John Wiley & Sons, vol. 45(2), pages 219-230, March.
- Tomoaki Akiba & Hisashi Yamamoto, 2001. "Reliability of a 2‐dimensional k‐within‐consecutive‐r × s‐out‐of‐m × n:F system," Naval Research Logistics (NRL), John Wiley & Sons, vol. 48(7), pages 625-637, October.
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Cited by:
- Zilong Feng & Tadashi Dohi & Won Young Yun, 2023. "System reliability analysis of a lamp problem by simulation," Journal of Risk and Reliability, , vol. 237(6), pages 1186-1198, December.
- Yi, He & Balakrishnan, Narayanaswamy & Li, Xiang, 2023. "Reliability of three-dimensional consecutive k-type systems," Reliability Engineering and System Safety, Elsevier, vol. 233(C).
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