Two-dimensional discrete scan statistics
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- James Fu & Markos Koutras, 1994. "Poisson approximations for 2-dimensional patterns," Annals of the Institute of Statistical Mathematics, Springer;The Institute of Statistical Mathematics, vol. 46(1), pages 179-192, March.
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- Markos V. Koutras & Demetrios P. Lyberopoulos, 2018. "Asymptotic results for jump probabilities associated to the multiple scan statistic," Annals of the Institute of Statistical Mathematics, Springer;The Institute of Statistical Mathematics, vol. 70(5), pages 951-968, October.
- Yi, He & Balakrishnan, Narayanaswamy & Li, Xiang, 2023. "Reliability of three-dimensional consecutive k-type systems," Reliability Engineering and System Safety, Elsevier, vol. 233(C).
- Chen, Jie & Glaz, Joseph, 2002. "Approximations for a conditional two-dimensional scan statistic," Statistics & Probability Letters, Elsevier, vol. 58(3), pages 287-296, July.
- Joseph Glaz & Marco Guerriero & Rohini Sen, 2010. "Approximations for a Three Dimensional Scan Statistic," Methodology and Computing in Applied Probability, Springer, vol. 12(4), pages 731-747, December.
- Martin Kulldorff & Zixing Fang & Stephen J Walsh, 2003. "A Tree-Based Scan Statistic for Database Disease Surveillance," Biometrics, The International Biometric Society, vol. 59(2), pages 323-331, June.
- Carey E. Priebe & John M. Conroy & David J. Marchette & Youngser Park, 2005. "Scan Statistics on Enron Graphs," Computational and Mathematical Organization Theory, Springer, vol. 11(3), pages 229-247, October.
- John Kornak & Mark Irwin & Noel Cressie, 2006. "Spatial Point Process Models of Defensive Strategies: Detecting Changes," Statistical Inference for Stochastic Processes, Springer, vol. 9(1), pages 31-46, May.
- G. Haiman & C. Preda, 2006. "Estimation for the Distribution of Two-dimensional Discrete Scan Statistics," Methodology and Computing in Applied Probability, Springer, vol. 8(3), pages 373-382, September.
- Michael V. Boutsikas & Markos V. Koutras, 2000. "Reliability Approximation for Markov Chain Imbeddable Systems," Methodology and Computing in Applied Probability, Springer, vol. 2(4), pages 393-411, December.
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Keywords
Bonferroni-type inequality Compound Poisson approximation Moving window detection Multiple scan statistic Poisson approximations Product-type approximation Testing uniformity in two dimensions;Statistics
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