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A quick switching sampling system by variables for controlling lot fraction nonconforming

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  • Shih-Wen Liu
  • Chien-Wei Wu

Abstract

This article develops a new sampling scheme by variables inspection, namely a quick switching sampling (QSS) system based on the process yield index for lot determination when the quality characteristic is normally distributed with two specification limits. The QSS system can provide a flexible sampling procedure by switching decision policies, normal inspection and tightened inspection. The operating characteristic curve of the proposed QSS system is derived and required to pass through two designed points, acceptable quality level and limiting quality level for satisfying risks simultaneously suffered by the producer and the consumer. The proposed sampling system’s performance is investigated and a comparison with the conventional variables single sampling (VSS) plan is also examined. The results indicate that the proposed system outperforms the VSS plan by requiring a smaller sample size for inspection while retaining the same protection. For practical purposes, the plan parameters’ tables are provided on the basis of various selected quality requirements and risks. Finally, we demonstrate the proposed sampling system using an example taken from a silicone LED lens industry.

Suggested Citation

  • Shih-Wen Liu & Chien-Wei Wu, 2016. "A quick switching sampling system by variables for controlling lot fraction nonconforming," International Journal of Production Research, Taylor & Francis Journals, vol. 54(6), pages 1839-1849, March.
    • Handle: RePEc:taf:tprsxx:v:54:y:2016:i:6:p:1839-1849
    DOI: 10.1080/00207543.2015.1084062
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    References listed on IDEAS

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    1. W. Pearn & G. Lin & K. Wang, 2004. "Normal Approximation to the Distribution of the Estimated Yield Index S pk," Quality & Quantity: International Journal of Methodology, Springer, vol. 38(1), pages 95-111, February.
    2. Wu, Chien-Wei & Aslam, Muhammad & Jun, Chi-Hyuck, 2012. "Variables sampling inspection scheme for resubmitted lots based on the process capability index Cpk," European Journal of Operational Research, Elsevier, vol. 217(3), pages 560-566.
    3. Wu, Chien-Wei, 2012. "An efficient inspection scheme for variables based on Taguchi capability index," European Journal of Operational Research, Elsevier, vol. 223(1), pages 116-122.
    4. Chien-Wei Wu & Mou-Yuan Liao & James C. Chen, 2012. "An improved approach for constructing lower confidence bound on process yield," European Journal of Industrial Engineering, Inderscience Enterprises Ltd, vol. 6(3), pages 369-390.
    5. Balamurali, S. & Jun, Chi-Hyuck, 2007. "Multiple dependent state sampling plans for lot acceptance based on measurement data," European Journal of Operational Research, Elsevier, vol. 180(3), pages 1221-1230, August.
    6. S. Balamurali & Chi-Hyuck Jun, 2009. "Designing of a variables two-plan system by minimizing the average sample number," Journal of Applied Statistics, Taylor & Francis Journals, vol. 36(10), pages 1159-1172.
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