Automated optical inspection system for surface mount device light emitting diodes
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DOI: 10.1007/s10845-016-1270-6
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References listed on IDEAS
- Chien-Chang Hsu & Min-Sheng Chen, 2016. "Intelligent maintenance prediction system for LED wafer testing machine," Journal of Intelligent Manufacturing, Springer, vol. 27(2), pages 335-342, April.
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Cited by:
- Zheng Xiao & Zhenan Wang & Deng Liu & Hui Wang, 2022. "A path planning algorithm for PCB surface quality automatic inspection," Journal of Intelligent Manufacturing, Springer, vol. 33(6), pages 1829-1841, August.
- Chih-Kai Cheng & Hung-Yin Tsai, 2022. "Enhanced detection of diverse defects by developing lighting strategies using multiple light sources based on reinforcement learning," Journal of Intelligent Manufacturing, Springer, vol. 33(8), pages 2357-2369, December.
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Keywords
LED package component; Defect inspection; Texture inspection; Adaptive Fourier analysis;All these keywords.
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