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A simple Bayes analysis of Weibull Based Accelerated Test model

Author

Listed:
  • Rijji Sen

    (Banaras Hindu University)

  • Rakesh Ranjan

    (Banaras Hindu University)

  • S. K. Upadhyay

    (Banaras Hindu University
    Banaras Hindu University)

Abstract

This paper considers a simple Bayes analysis of a two-parameter Weibull distribution in an accelerated test scenario when the scale parameter is regressed according to power law relationship. The analysis is done using independent, vague priors for the parameters. Experiments involving both complete and censored data sets are assumed from the model. Appropriate numerical illustrations are provided using real datasets. The results are found to be satisfactory.

Suggested Citation

  • Rijji Sen & Rakesh Ranjan & S. K. Upadhyay, 2017. "A simple Bayes analysis of Weibull Based Accelerated Test model," International Journal of System Assurance Engineering and Management, Springer;The Society for Reliability, Engineering Quality and Operations Management (SREQOM),India, and Division of Operation and Maintenance, Lulea University of Technology, Sweden, vol. 8(1), pages 505-511, January.
    • Handle: RePEc:spr:ijsaem:v:8:y:2017:i:1:d:10.1007_s13198-015-0389-8
    DOI: 10.1007/s13198-015-0389-8
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    References listed on IDEAS

    as
    1. S. Upadhyay & M. Peshwani, 2008. "Posterior analysis of lognormal regression models using the Gibbs sampler," Statistical Papers, Springer, vol. 49(1), pages 59-85, March.
    2. W. R. Gilks & P. Wild, 1992. "Adaptive Rejection Sampling for Gibbs Sampling," Journal of the Royal Statistical Society Series C, Royal Statistical Society, vol. 41(2), pages 337-348, June.
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