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Terminal reliability analysis of multistage interconnection networks

Author

Listed:
  • Amit Prakash

    (National Institute of Technology, Jamshedpur)

  • Dilip Kumar Yadav

    (National Institute of Technology, Jamshedpur)

  • Arvind Choubey

    (IIIT Bhagalpur)

Abstract

Terminal reliability of multistage interconnection network (MIN) is the probability of at least one fault free path between any source–destination nodes pair. MIN is used to interconnect processors and memory modules in multi-processor system. In this paper, terminal reliability is estimated and validated for existing MINs (i.e., SEN, SEN+, SEN+2, GIN, CGIN, PCGIN, 3D-GIN, 4D-GIN-1, 4D-GIN-2, 4D-GIN-3, and SEGINs). The comparison and performance analysis of MINs based on various indices are also presented.

Suggested Citation

  • Amit Prakash & Dilip Kumar Yadav & Arvind Choubey, 2020. "Terminal reliability analysis of multistage interconnection networks," International Journal of System Assurance Engineering and Management, Springer;The Society for Reliability, Engineering Quality and Operations Management (SREQOM),India, and Division of Operation and Maintenance, Lulea University of Technology, Sweden, vol. 11(1), pages 110-125, February.
    • Handle: RePEc:spr:ijsaem:v:11:y:2020:i:1:d:10.1007_s13198-019-00929-z
    DOI: 10.1007/s13198-019-00929-z
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    References listed on IDEAS

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    1. Bistouni, Fathollah & Jahanshahi, Mohsen, 2014. "Analyzing the reliability of shuffle-exchange networks using reliability block diagrams," Reliability Engineering and System Safety, Elsevier, vol. 132(C), pages 97-106.
    2. Gunawan, Indra, 2008. "Reliability analysis of shuffle-exchange network systems," Reliability Engineering and System Safety, Elsevier, vol. 93(2), pages 271-276.
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