An adaptive estimator of the memory parameter and the goodness-of-fit test using a multidimensional increment ratio statistic
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DOI: 10.1016/j.jmva.2011.09.003
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- E. Moulines & F. Roueff & M. S. Taqqu, 2007. "On the Spectral Density of the Wavelet Coefficients of Long‐Memory Time Series with Application to the Log‐Regression Estimation of the Memory Parameter," Journal of Time Series Analysis, Wiley Blackwell, vol. 28(2), pages 155-187, March.
- Liudas Giraitis & Peter M. Robinson & Alexander Samarov, 1997. "Rate Optimal Semiparametric Estimation Of The Memory Parameter Of The Gaussian Time Series With Long‐Range Dependence," Journal of Time Series Analysis, Wiley Blackwell, vol. 18(1), pages 49-60, January.
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- Bardet Jean-Marc & Dola Béchir, 2016. "Semiparametric Stationarity and Fractional Unit Roots Tests Based on Data-Driven Multidimensional Increment Ratio Statistics," Journal of Time Series Econometrics, De Gruyter, vol. 8(2), pages 115-153, July.
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Keywords
Long-memory Gaussian processes; Goodness-of-fit test; Estimation of the memory parameter; Minimax adaptive estimator;All these keywords.
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