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Dependence of multifractal analysis parameters on the darkness of a processed image

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  • Martsepp, Merike
  • Laas, Tõnu
  • Laas, Katrin
  • Priimets, Jaanis
  • Tõkke, Siim
  • Mikli, Valdek

Abstract

In this study, four specimens of pure tungsten, which have been irradiated with a high-temperature plasma with 20, 40, 60, and 80 pulses, respectively, are considered. Scanning electron microscopy (SEM) and optical microscope (OM) images of these specimens are used to search for more suitable degrees of darkness for binarizing the images for multifractal analysis. The multifractal characteristics obtained from SEM and OM images are then compared for the same specimens. The study shows the application of multifractal analysis to SEM images is robust enough as the change of binarization level in a range of 30-70% leads to a change of multifractal characteristics about 0.5%. It has been found that the optimal binarization level for OM images is about 10%.

Suggested Citation

  • Martsepp, Merike & Laas, Tõnu & Laas, Katrin & Priimets, Jaanis & Tõkke, Siim & Mikli, Valdek, 2022. "Dependence of multifractal analysis parameters on the darkness of a processed image," Chaos, Solitons & Fractals, Elsevier, vol. 156(C).
    • Handle: RePEc:eee:chsofr:v:156:y:2022:i:c:s0960077922000224
    DOI: 10.1016/j.chaos.2022.111811
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    References listed on IDEAS

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    1. Sijilmassi, Ouafa & López Alonso, José-Manuel & Del Río Sevilla, Aurora & Barrio Asensio, María del Carmen, 2020. "Multifractal analysis of embryonic eye structures from female mice with dietary folic acid deficiency. Part I: Fractal dimension, lacunarity, divergence, and multifractal spectrum," Chaos, Solitons & Fractals, Elsevier, vol. 138(C).
    2. Gabriel-Guzmán, Mauricio & Rivera, Victor M. & Cocotle-Ronzón, Yolanda & García-Díaz, Samuel & Hernandez-Martinez, Eliseo, 2017. "Fractality in coffee bean surface for roasting process," Chaos, Solitons & Fractals, Elsevier, vol. 99(C), pages 79-84.
    3. Chauveau, Julien & Rousseau, David & Richard, Paul & Chapeau-Blondeau, François, 2010. "Multifractal analysis of three-dimensional histogram from color images," Chaos, Solitons & Fractals, Elsevier, vol. 43(1), pages 57-67.
    4. Panigrahy, Chinmaya & Seal, Ayan & Mahato, Nihar Kumar & Bhattacharjee, Debotosh, 2019. "Differential box counting methods for estimating fractal dimension of gray-scale images: A survey," Chaos, Solitons & Fractals, Elsevier, vol. 126(C), pages 178-202.
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