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Semiparametric Analysis of Correlated Recurrent and Terminal Events

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  • Yining Ye
  • John D. Kalbfleisch
  • Douglas E. Schaubel

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  • Yining Ye & John D. Kalbfleisch & Douglas E. Schaubel, 2007. "Semiparametric Analysis of Correlated Recurrent and Terminal Events," Biometrics, The International Biometric Society, vol. 63(1), pages 78-87, March.
    • Handle: RePEc:bla:biomet:v:63:y:2007:i:1:p:78-87
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    File URL: http://hdl.handle.net/10.1111/j.1541-0420.2006.00677.x
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    References listed on IDEAS

    as
    1. Debashis Ghosh & D. Y. Lin, 2000. "Nonparametric Analysis of Recurrent Events and Death," Biometrics, The International Biometric Society, vol. 56(2), pages 554-562, June.
    2. Chiung-Yu Huang & Mei-Cheng Wang, 2004. "Joint Modeling and Estimation for Recurrent Event Processes and Failure Time Data," Journal of the American Statistical Association, American Statistical Association, vol. 99, pages 1153-1165, December.
    3. Lei Liu & Robert A. Wolfe & Xuelin Huang, 2004. "Shared Frailty Models for Recurrent Events and a Terminal Event," Biometrics, The International Biometric Society, vol. 60(3), pages 747-756, September.
    4. D. Y. Lin & L. J. Wei & I. Yang & Z. Ying, 2000. "Semiparametric regression for the mean and rate functions of recurrent events," Journal of the Royal Statistical Society Series B, Royal Statistical Society, vol. 62(4), pages 711-730.
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