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Parametric estimation of hidden stochastic model by contrast minimization and deconvolution: application to the Stochastic Volatility Model

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  • Salima El Kolei

Abstract

We study a new parametric approach for particular hidden stochastic models such as the Stochastic Volatility model. This method is based on contrast minimization and deconvolution. After proving consistency and asymptotic normality of the estimation leading to asymptotic confidence intervals, we provide a thorough numerical study, which compares most of the classical methods that are used in practice (Quasi Maximum Likelihood estimator, Simulated Expectation Maximization Likelihood estimator and Bayesian estimators). We prove that our estimator clearly outperforms the Maximum Likelihood Estimator in term of computing time, but also most of the other methods. We also show that this contrast method is the most robust with respect to non Gaussianity of the error and also does not need any tuning parameter.

Suggested Citation

  • Salima El Kolei, 2012. "Parametric estimation of hidden stochastic model by contrast minimization and deconvolution: application to the Stochastic Volatility Model," Papers 1202.2559, arXiv.org, revised Mar 2013.
    • Handle: RePEc:arx:papers:1202.2559
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    References listed on IDEAS

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    1. Jacquier, Eric & Polson, Nicholas G & Rossi, Peter E, 2002. "Bayesian Analysis of Stochastic Volatility Models," Journal of Business & Economic Statistics, American Statistical Association, vol. 20(1), pages 69-87, January.
    2. Melino, Angelo & Turnbull, Stuart M., 1990. "Pricing foreign currency options with stochastic volatility," Journal of Econometrics, Elsevier, vol. 45(1-2), pages 239-265.
    3. Sangjoon Kim & Neil Shephard & Siddhartha Chib, 1998. "Stochastic Volatility: Likelihood Inference and Comparison with ARCH Models," The Review of Economic Studies, Review of Economic Studies Ltd, vol. 65(3), pages 361-393.
    4. Ronald J. Mahieu & Peter C. Schotman, 1998. "An empirical application of stochastic volatility models," Journal of Applied Econometrics, John Wiley & Sons, Ltd., vol. 13(4), pages 333-360.
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