Optimum step‐stress accelerated life test plans for log‐location‐scale distributions
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DOI: 10.1002/nav.20299
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- Do Sun Bai & Myung Soo Kim, 1993. "Optimum simple step‐stress accelerated life tests for weibull distribution and type I censoring," Naval Research Logistics (NRL), John Wiley & Sons, vol. 40(2), pages 193-210, March.
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