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Parametric inference for progressive Type-I hybrid censored data on a simple step-stress accelerated life test model

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  • Ling, Li
  • Xu, Wei
  • Li, Minghai

Abstract

This paper considers a simple step-stress accelerated life test model under progressive Type-I hybrid censoring scheme. The progressive Type-I hybrid censoring scheme and statistical method in synthetic accelerated stresses are provided so as to decrease the lifetime and reduce the test cost. An exponentially distributed life of test units and a cumulative exposure model are assumed. The maximum likelihood estimates of the model parameters are obtained using a pivotal quantity. Two useful lemmas and a theorem are given to construct the approximate confidence intervals for the model parameters. Finally, simulation results are provided to assess the method of inference developed in this article. The simulation results show that the method does improve for large sample size.

Suggested Citation

  • Ling, Li & Xu, Wei & Li, Minghai, 2009. "Parametric inference for progressive Type-I hybrid censored data on a simple step-stress accelerated life test model," Mathematics and Computers in Simulation (MATCOM), Elsevier, vol. 79(10), pages 3110-3121.
    • Handle: RePEc:eee:matcom:v:79:y:2009:i:10:p:3110-3121
    DOI: 10.1016/j.matcom.2009.03.002
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    References listed on IDEAS

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    1. Do Sun Bai & Myung Soo Kim, 1993. "Optimum simple step‐stress accelerated life tests for weibull distribution and type I censoring," Naval Research Logistics (NRL), John Wiley & Sons, vol. 40(2), pages 193-210, March.
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    Cited by:

    1. Chunfang Zhang & Yimin Shi, 2017. "Optimum simple accelerated life tests based on progressively Type-I hybrid censoring," International Journal of System Assurance Engineering and Management, Springer;The Society for Reliability, Engineering Quality and Operations Management (SREQOM),India, and Division of Operation and Maintenance, Lulea University of Technology, Sweden, vol. 8(2), pages 849-856, November.
    2. Oh, Hyunseok & Choi, Seunghyuk & Kim, Keunsu & Youn, Byeng D. & Pecht, Michael, 2015. "An empirical model to describe performance degradation for warranty abuse detection in portable electronics," Reliability Engineering and System Safety, Elsevier, vol. 142(C), pages 92-99.
    3. Ismail, Ali A., 2019. "Statistical analysis of Type-I progressively hybrid censored data under constant-stress life testing model," Physica A: Statistical Mechanics and its Applications, Elsevier, vol. 520(C), pages 138-150.

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