Fixing the Patent Office
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DOI: 10.1086/668240
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Citations
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Cited by:
- Schankerman, Mark & Schuett, Florian, 2016. "Screening for Patent Quality," CEPR Discussion Papers 11688, C.E.P.R. Discussion Papers.
- Schankerman, Mark & Schütt, Florian, 2016.
"Screening for Patent Quality : Examination, Fees, and the Courts,"
Other publications TiSEM
e9210a8e-ff3b-4f03-823b-a, Tilburg University, School of Economics and Management.
- Schankerman, Mark & Schütt, Florian, 2016. "Screening for Patent Quality : Examination, Fees, and the Courts," Discussion Paper 2016-036, Tilburg University, Tilburg Law and Economic Center.
- Schankerman, Mark & Schütt, Florian, 2016. "Screening for Patent Quality : Examination, Fees, and the Courts," Discussion Paper 2016-046, Tilburg University, Center for Economic Research.
- Schankerman, Mark & Schütt, Florian, 2016. "Screening for Patent Quality : Examination, Fees, and the Courts," Other publications TiSEM fa319822-6e68-4e05-8547-4, Tilburg University, School of Economics and Management.
- Raffiee, Joseph & Teodoridis, Florenta & Fehder, Daniel, 2023. "Partisan patent examiners? Exploring the link between the political ideology of patent examiners and patent office outcomes," Research Policy, Elsevier, vol. 52(9).
- Neil Gandal & Michal Shur-Ofry & Michael Crystal & Royee Shilony, 2021. "Out of sight: patents that have never been cited," Scientometrics, Springer;Akadémiai Kiadó, vol. 126(4), pages 2903-2929, April.
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