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Testing of Suspected Observations in an Exponential Sample With Unknown Origin

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  • Nirpeksh Kumar

Abstract

The problem of multiple upper outliers in two-parameter exponential sample is considered. A test statistic is proposed to identify the outliers at the upper end of the sample. The null distribution of the test statistic is obtained and the critical values are found. The performance of the test is also compared with the earlier work.

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  • Nirpeksh Kumar, 2015. "Testing of Suspected Observations in an Exponential Sample With Unknown Origin," Communications in Statistics - Theory and Methods, Taylor & Francis Journals, vol. 44(17), pages 3668-3679, September.
    • Handle: RePEc:taf:lstaxx:v:44:y:2015:i:17:p:3668-3679
    DOI: 10.1080/03610926.2013.847100
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    Cited by:

    1. Chien-Tai Lin & Ying-Chen Lee & Narayanaswamy Balakrishnan, 2019. "Package mTEXO for testing the presence of outliers in exponential samples," Computational Statistics, Springer, vol. 34(2), pages 803-818, June.
    2. Nirpeksh Kumar, 2019. "Exact distributions of tests of outliers for exponential samples," Statistical Papers, Springer, vol. 60(6), pages 2031-2061, December.

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