Package mTEXO for testing the presence of outliers in exponential samples
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DOI: 10.1007/s00180-018-0843-6
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- A. C. Kimber, 1982. "Tests for Many Outliers in an Exponential Sample," Journal of the Royal Statistical Society Series C, Royal Statistical Society, vol. 31(3), pages 263-271, November.
- Nirpeksh Kumar, 2015. "Testing of Suspected Observations in an Exponential Sample With Unknown Origin," Communications in Statistics - Theory and Methods, Taylor & Francis Journals, vol. 44(17), pages 3668-3679, September.
- Lin, Chien-Tai & Balakrishnan, N., 2009. "Exact computation of the null distribution of a test for multiple outliers in an exponential sample," Computational Statistics & Data Analysis, Elsevier, vol. 53(9), pages 3281-3290, July.
- Jin Zhang, 1998. "Tests for multiple upper or lower outliers in an exponential sample," Journal of Applied Statistics, Taylor & Francis Journals, vol. 25(2), pages 245-255.
- Chien-Tai Lin & Shih-Chun Wang, 2015. "Discordancy tests for two-parameter exponential samples," Statistical Papers, Springer, vol. 56(2), pages 569-582, May.
- A. C. Kimber & H. J. Stevens, 1981. "The Null Distribution of a Test for Two Upper Outliers in an Exponential Sample," Journal of the Royal Statistical Society Series C, Royal Statistical Society, vol. 30(2), pages 153-157, June.
- D. Kabe, 1970. "Testing outliers from an exponential population," Metrika: International Journal for Theoretical and Applied Statistics, Springer, vol. 15(1), pages 15-18, December.
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Keywords
Critical value; Discordancy test; Exponential distribution; Spacings; User interface;All these keywords.
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