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An NP Control Chart Using Double Inspections

Author

Listed:
  • Zhang Wu
  • Qinan Wang

Abstract

The np control chart is used widely in Statistical Process Control (SPC) for attributes. It is difficult to design an np chart that simultaneously satisfies a requirement on false alarm rate and has high detection effectiveness. This is mainly because one is often unable to make the in-control Average Run Length ARL0 of an np chart close to a specified or desired value. This article proposes a new np control chart which is able to overcome the problems suffered by the conventional np chart. It is called the Double Inspection (DI) np chart, because it uses a double inspection scheme to decide the process status (in control or out of control). The first inspection decides the process status according to the number of non-conforming units found in a sample; and the second inspection makes a decision based on the location of a particular non-conforming unit in the sample. The double inspection scheme makes the in-control ARL0 very close to a specified value and the out-of-control Average Run Length ARL1 quite small. As a result, the requirement on a false alarm rate is satisfied and the detection effectiveness also achieves a high level. Moreover, the DI np chart retains the operational simplicity of the np chart to a large degree and achieves the performance improvement without requiring extra inspection (testing whether a unit is conforming or not).

Suggested Citation

  • Zhang Wu & Qinan Wang, 2007. "An NP Control Chart Using Double Inspections," Journal of Applied Statistics, Taylor & Francis Journals, vol. 34(7), pages 843-855.
    • Handle: RePEc:taf:japsta:v:34:y:2007:i:7:p:843-855
    DOI: 10.1080/02664760701523492
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    Citations

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    Cited by:

    1. Sajid Ali & Shayaan Rajput & Ismail Shah & Hassan Houmani, 2023. "Process Monitoring Using Truncated Gamma Distribution," Stats, MDPI, vol. 6(4), pages 1-25, December.
    2. Samrad Jafarian-Namin & Muhammad Aslam & Mohammad Saber Fallah Nezhad & Fatemeh Eskandari-Kataki, 2021. "Efficient designs of modeling attribute control charts for a Weibull distribution under truncated life tests," OPSEARCH, Springer;Operational Research Society of India, vol. 58(4), pages 942-961, December.
    3. Jose Jorge Muñoz & Manuel J. Campuzano & Jaime Mosquera, 2022. "Optimized np Attribute Control Chart Using Triple Sampling," Mathematics, MDPI, vol. 10(20), pages 1-21, October.

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