Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing
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DOI: 10.1007/s10845-014-0956-x
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References listed on IDEAS
- Glenn F. Lindsay & Albert B. Bishop, 1964. "Allocation of Screening Inspection Effort--A Dynamic-Programming Approach," Management Science, INFORMS, vol. 10(2), pages 342-352, January.
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Cited by:
- Boumallessa, Zeineb & Chouikhi, Houssam & Elleuch, Mounir & Bentaher, Hatem, 2023. "Modeling and optimizing the maintenance schedule using dynamic quality and machine condition monitors in an unreliable single production system," Reliability Engineering and System Safety, Elsevier, vol. 235(C).
- Jia Hao & Mengying Zhou & Guoxin Wang & Liangyue Jia & Yan Yan, 2020. "Design optimization by integrating limited simulation data and shape engineering knowledge with Bayesian optimization (BO-DK4DO)," Journal of Intelligent Manufacturing, Springer, vol. 31(8), pages 2049-2067, December.
- Mustapha Anwar Brahami & Mohammed Dahane & Mehdi Souier & M’hammed Sahnoun, 2022. "Sustainable capacitated facility location/network design problem: a Non-dominated Sorting Genetic Algorithm based multiobjective approach," Annals of Operations Research, Springer, vol. 311(2), pages 821-852, April.
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Keywords
Genetic algorithm; Sampling; Control plan; Wafer at risk; Simulation; Multi-objective optimization;All these keywords.
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