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Allocation of Screening Inspection Effort--A Dynamic-Programming Approach

Author

Listed:
  • Glenn F. Lindsay

    (The Ohio Slate University, Columbus)

  • Albert B. Bishop

    (The Ohio Slate University, Columbus)

Abstract

A general screening inspection program is developed in which inspection levels and the locations of inspection points are treated as variables. It is shown that the function representing the total of inspection and scrap costs will be minimized by an extreme-point solution, thus the minimum-cost inspection program will lie in a relatively restricted subset of all possible allocations. Application of a computational procedure based on dynamic-programming allows the minimum-cost program to be readily determined for instances in which the requirement for inspection is the maintenance of a specified quality level or when a linear cost may be associated with outgoing defective material.

Suggested Citation

  • Glenn F. Lindsay & Albert B. Bishop, 1964. "Allocation of Screening Inspection Effort--A Dynamic-Programming Approach," Management Science, INFORMS, vol. 10(2), pages 342-352, January.
    • Handle: RePEc:inm:ormnsc:v:10:y:1964:i:2:p:342-352
    DOI: 10.1287/mnsc.10.2.342
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    Cited by:

    1. Van Volsem, Sofie & Dullaert, Wout & Van Landeghem, Hendrik, 2007. "An Evolutionary Algorithm and discrete event simulation for optimizing inspection strategies for multi-stage processes," European Journal of Operational Research, Elsevier, vol. 179(3), pages 621-633, June.
    2. Salih Tekin & Sigrún Andradóttir, 2020. "Inspection location in capacity-constrained lines," Central European Journal of Operations Research, Springer;Slovak Society for Operations Research;Hungarian Operational Research Society;Czech Society for Operations Research;Österr. Gesellschaft für Operations Research (ÖGOR);Slovenian Society Informatika - Section for Operational Research;Croatian Operational Research Society, vol. 28(3), pages 905-937, September.
    3. M’hammed Sahnoun & Belgacem Bettayeb & Samuel-Jean Bassetto & Michel Tollenaere, 2016. "Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing," Journal of Intelligent Manufacturing, Springer, vol. 27(6), pages 1335-1349, December.
    4. Jewkes, Elizabeth M., 1995. "Optimal inspection effort and scheduling for a manufacturing process with repair," European Journal of Operational Research, Elsevier, vol. 85(2), pages 340-351, September.
    5. Rebello, Ranjit & Agnetis, Alessandro & Mirchandani, Pitu B., 1995. "Specialized inspection problems in serial production systems," European Journal of Operational Research, Elsevier, vol. 80(2), pages 277-296, January.
    6. Paul F. Zantek & Gordon P. Wright & Robert D. Plante, 2002. "Process and Product Improvement in Manufacturing Systems with Correlated Stages," Management Science, INFORMS, vol. 48(5), pages 591-606, May.

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