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Estimation under failure-censored step-stress life test for the generalized exponential distribution parameters

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  • Ali A. Ismail

    (King Saud University, College of Science
    Cairo University)

Abstract

Accelerated life testing of materials is used to collect failure data quickly when the lifetime of a specimen under use condition is too long. This article considers estimates of the generalized exponential distribution parameters under step-stress partially accelerated life testing with Type-II censoring. The maximum likelihood approach is applied to derive point and asymptotic confidence interval estimations of the model parameters. The performance of the estimators is evaluated numerically for different parameter values and different sample sizes via their mean square error. Also, the average confidence intervals lengths and the associated coverage probabilities are obtained. A simulation study is conducted for illustration.

Suggested Citation

  • Ali A. Ismail, 2014. "Estimation under failure-censored step-stress life test for the generalized exponential distribution parameters," Indian Journal of Pure and Applied Mathematics, Springer, vol. 45(6), pages 1003-1015, December.
    • Handle: RePEc:spr:indpam:v:45:y:2014:i:6:d:10.1007_s13226-014-0101-8
    DOI: 10.1007/s13226-014-0101-8
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    References listed on IDEAS

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    1. Morris H. Degroot & Prem K. Goel, 1979. "Bayesian estimation and optimal designs in partially accelerated life testing," Naval Research Logistics Quarterly, John Wiley & Sons, vol. 26(2), pages 223-235, June.
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