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The wafer probing scheduling problem (WPSP)

Author

Listed:
  • W L Pearn

    (National Chiao Tung University)

  • S H Chung

    (National Chiao Tung University)

  • M H Yang

    (Lien-Ho Institute of Technology)

Abstract

The wafer probing scheduling problem (WPSP) is a variation of the parallel-machine scheduling problem, which has many real-world applications, particularly, in the integrated circuit (IC) manufacturing industry. In the wafer probing factories, the jobs are clustered by their product types, which must be processed on groups of identical parallel machines and be completed before the due dates. Further, the job processing time depends on the product type, and the machine setup time is sequence dependent on the orders of jobs processed. Since the wafer probing scheduling problem involves constraints on job clusters, job-cluster dependent processing time, due dates, machine capacity, and sequence dependent setup time, it is more difficult to solve than the classical parallel-machine scheduling problem. In this paper, we formulate the WPSP as an integer programming problem. We also transform the WPSP into the vehicle routing problem with time windows (VRPTW), a well-known network routing problem which has been investigated extensively. An illustrative example is given to demonstrate the proposed transformation. Based on the provided transformation, we present three efficient algorithms to solve the WPSP near-optimally.

Suggested Citation

  • W L Pearn & S H Chung & M H Yang, 2002. "The wafer probing scheduling problem (WPSP)," Journal of the Operational Research Society, Palgrave Macmillan;The OR Society, vol. 53(8), pages 864-874, August.
    • Handle: RePEc:pal:jorsoc:v:53:y:2002:i:8:d:10.1057_palgrave.jors.2601362
    DOI: 10.1057/palgrave.jors.2601362
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    Citations

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    Cited by:

    1. Allahverdi, Ali & Ng, C.T. & Cheng, T.C.E. & Kovalyov, Mikhail Y., 2008. "A survey of scheduling problems with setup times or costs," European Journal of Operational Research, Elsevier, vol. 187(3), pages 985-1032, June.
    2. W L Pearn & S H Chung & M H Yang & Y H Chen, 2004. "Algorithms for the wafer probing scheduling problem with sequence-dependent set-up time and due date restrictions," Journal of the Operational Research Society, Palgrave Macmillan;The OR Society, vol. 55(11), pages 1194-1207, November.
    3. Pearn, W. L. & Chung, S. H. & Chen, A. Y. & Yang, M. H., 2004. "A case study on the multistage IC final testing scheduling problem with reentry," International Journal of Production Economics, Elsevier, vol. 88(3), pages 257-267, April.
    4. Gedik, Ridvan & Rainwater, Chase & Nachtmann, Heather & Pohl, Ed A., 2016. "Analysis of a parallel machine scheduling problem with sequence dependent setup times and job availability intervals," European Journal of Operational Research, Elsevier, vol. 251(2), pages 640-650.

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