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Sub-nanometer-scale mapping of crystal orientation and depth-dependent structure of dislocation cores in SrTiO3

Author

Listed:
  • Haozhi Sha

    (Tsinghua University
    Tsinghua University
    Tsinghua University)

  • Yunpeng Ma

    (Tsinghua University
    Tsinghua University)

  • Guoping Cao

    (Tsinghua University
    Tsinghua University
    Tsinghua University)

  • Jizhe Cui

    (Tsinghua University
    Tsinghua University
    Tsinghua University)

  • Wenfeng Yang

    (Tsinghua University
    Tsinghua University
    Tsinghua University)

  • Qian Li

    (Tsinghua University
    Tsinghua University)

  • Rong Yu

    (Tsinghua University
    Tsinghua University
    Tsinghua University)

Abstract

Defects in crystals play a fundamental role in modulating mechanical, electrical, luminescent, and magnetic behaviors of materials. However, accurate measurement of defect structures is hindered by symmetry breaking and the corresponding complex modifications in atomic configuration and/or crystal tilt at the defects. Here, we report the deep-sub-angstrom resolution imaging of dislocation cores via multislice electron ptychography with adaptive propagator, which allows sub-nanometer scale mapping of crystal tilt in the vicinity of dislocation cores and simultaneous recovery of depth-dependent atomic structure of dislocations. The realization of deep-sub-angstrom resolution and depth-dependent imaging of defects shows great potential in revealing microstructures and properties of real materials and devices.

Suggested Citation

  • Haozhi Sha & Yunpeng Ma & Guoping Cao & Jizhe Cui & Wenfeng Yang & Qian Li & Rong Yu, 2023. "Sub-nanometer-scale mapping of crystal orientation and depth-dependent structure of dislocation cores in SrTiO3," Nature Communications, Nature, vol. 14(1), pages 1-8, December.
    • Handle: RePEc:nat:natcom:v:14:y:2023:i:1:d:10.1038_s41467-023-35877-7
    DOI: 10.1038/s41467-023-35877-7
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    Cited by:

    1. Zhongqiang Chen & Hongsong Qiu & Xinjuan Cheng & Jizhe Cui & Zuanming Jin & Da Tian & Xu Zhang & Kankan Xu & Ruxin Liu & Wei Niu & Liqi Zhou & Tianyu Qiu & Yequan Chen & Caihong Zhang & Xiaoxiang Xi &, 2024. "Defect-induced helicity dependent terahertz emission in Dirac semimetal PtTe2 thin films," Nature Communications, Nature, vol. 15(1), pages 1-11, December.
    2. Benedikt Diederichs & Ziria Herdegen & Achim Strauch & Frank Filbir & Knut Müller-Caspary, 2024. "Exact inversion of partially coherent dynamical electron scattering for picometric structure retrieval," Nature Communications, Nature, vol. 15(1), pages 1-9, December.

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