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Series Systems and Reliability Demonstration Tests

Author

Listed:
  • Saul Blumenthal

    (Ohio State University, Columbus, Ohio)

  • J. Arthur Greenwood

    (Oceanweather Inc., White Plains, New York)

  • Leon H. Herbach

    (Polytechnic Institute of New York, Brooklyn, New York)

Abstract

For series systems at equilibrium, the exponential distribution for times between failures is reasonably well justified. In the transient state, the exponential distribution applies also, but with a time varying scale parameter. Ignoring this parameter and using a partly aged system to make inferences about the mean life of a fully aged system can lead to very misleading outcomes. In particular, we show that reliability demonstration tests may have unacceptably high consumer's risk when applied in this manner.

Suggested Citation

  • Saul Blumenthal & J. Arthur Greenwood & Leon H. Herbach, 1984. "Series Systems and Reliability Demonstration Tests," Operations Research, INFORMS, vol. 32(3), pages 641-648, June.
    • Handle: RePEc:inm:oropre:v:32:y:1984:i:3:p:641-648
    DOI: 10.1287/opre.32.3.641
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    Citations

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    Cited by:

    1. Jianyu Xu & Qingpei Hu & Dan Yu & Min Xie, 2017. "Reliability demonstration test for load-sharing systems with exponential and Weibull components," PLOS ONE, Public Library of Science, vol. 12(12), pages 1-19, December.
    2. Liling Ge & Yingjie Zhang, 2019. "Improving operational reliability of manufacturing systems by process optimization via survival signatures," Journal of Risk and Reliability, , vol. 233(3), pages 444-454, June.
    3. Elezović-Hadžić, S. & Milošević, S. & Capel, H.W. & Wiersma, G.L., 1988. "Exact renormalization group treatment of the piecewise directed random walks on fractals," Physica A: Statistical Mechanics and its Applications, Elsevier, vol. 150(2), pages 402-418.
    4. Elezović-Hadz̆ić, S. & Milos̆ević, S. & Capel, H.W. & Post, Th., 1991. "Critical exponent γ for a class of directed walks at the fractal to Euclidean crossover," Physica A: Statistical Mechanics and its Applications, Elsevier, vol. 179(1), pages 39-61.
    5. Saul Blumenthal, 1992. "Reliability acceptance testing for new series systems," Naval Research Logistics (NRL), John Wiley & Sons, vol. 39(4), pages 579-597, June.
    6. Redinz, JoséArnaldo & de Magalhães, AglaéCristina Navarro, 1997. "Criticality of two- and three-spin Ising model in an external field on a fractal family," Physica A: Statistical Mechanics and its Applications, Elsevier, vol. 246(1), pages 27-44.

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