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A goodness-of-fit test based on neural network sieve estimators

Author

Listed:
  • Shen, Xiaoxi
  • Jiang, Chang
  • Sakhanenko, Lyudmila
  • Lu, Qing

Abstract

Neural networks have become increasingly popular in the field of machine learning and have been successfully used in many applied fields (e.g., imaging recognition). With more and more research has been conducted on neural networks, we have a better understanding of the statistical proprieties of neural networks. While many studies focus on bounding the prediction error of neural network estimators, limited research has been done on the statistical inference of neural networks. From a statistical point of view, it is of great interest to investigate the statistical inference of neural networks as it could facilitate hypothesis testing in many fields (e.g., genetics, epidemiology, and medical science). In this paper, we propose a goodness-of-fit test statistic based on neural network sieve estimators. The test statistic follows an asymptotic distribution, which makes it easy to use in practice. We have also verified the theoretical asymptotic results via simulation studies and a real data application.

Suggested Citation

  • Shen, Xiaoxi & Jiang, Chang & Sakhanenko, Lyudmila & Lu, Qing, 2021. "A goodness-of-fit test based on neural network sieve estimators," Statistics & Probability Letters, Elsevier, vol. 174(C).
  • Handle: RePEc:eee:stapro:v:174:y:2021:i:c:s0167715221000626
    DOI: 10.1016/j.spl.2021.109100
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    References listed on IDEAS

    as
    1. Xiaohong Chen & Xiaotong Shen, 1998. "Sieve Extremum Estimates for Weakly Dependent Data," Econometrica, Econometric Society, vol. 66(2), pages 289-314, March.
    2. Yatchew, Adonis John, 1992. "Nonparametric Regression Tests Based on Least Squares," Econometric Theory, Cambridge University Press, vol. 8(4), pages 435-451, December.
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    Keywords

    Donsker class; Nonparametric least squares;

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