An improved description of the dielectric breakdown in oxides based on a generalized Weibull distribution
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DOI: 10.1016/j.physa.2005.07.017
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- K. Jose & Shanoja Naik & Miroslav Ristić, 2010. "Marshall–Olkin q-Weibull distribution and max–min processes," Statistical Papers, Springer, vol. 51(4), pages 837-851, December.
- Nadarajah, Saralees & Kotz, Samuel, 2007. "On the q-type distributions," Physica A: Statistical Mechanics and its Applications, Elsevier, vol. 377(2), pages 465-468.
- Xiang Jia & Saralees Nadarajah & Bo Guo, 2020. "Inference on q-Weibull parameters," Statistical Papers, Springer, vol. 61(2), pages 575-593, April.
- Ewin Sánchez, 2023. "Q-Weibull distribution to explain the PM2.5 air pollution concentration in Santiago de Chile," The European Physical Journal B: Condensed Matter and Complex Systems, Springer;EDP Sciences, vol. 96(8), pages 1-8, August.
- Xu, Meng & Droguett, Enrique López & Lins, Isis Didier & das Chagas Moura, Márcio, 2017. "On the q-Weibull distribution for reliability applications: An adaptive hybrid artificial bee colony algorithm for parameter estimation," Reliability Engineering and System Safety, Elsevier, vol. 158(C), pages 93-105.
- Jose, K.K. & Naik, Shanoja R., 2008. "A class of asymmetric pathway distributions and an entropy interpretation," Physica A: Statistical Mechanics and its Applications, Elsevier, vol. 387(28), pages 6943-6951.
- Reyes-Santias, Francisco & Reboredo, Juan C. & de Assis, Edilson Machado & Rivera-Castro, Miguel A., 2021. "Does length of hospital stay reflect power-law behavior? A q-Weibull density approach," Physica A: Statistical Mechanics and its Applications, Elsevier, vol. 568(C).
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Keywords
Weibull distribution; Dielectric breakdown; Reliability; MOS devices;All these keywords.
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