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An Application of the Truncated Two‐Piece Normal Distribution to the Measurement of Depths of Arsenic Implants in Silicon

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  • A. C. Kimber
  • C. Jeynes

Abstract

The truncated two‐piece Normal distribution is applied to data obtained from backscattering experiments in order to investigate the depth of Arsenic implants in Silicon.

Suggested Citation

  • A. C. Kimber & C. Jeynes, 1987. "An Application of the Truncated Two‐Piece Normal Distribution to the Measurement of Depths of Arsenic Implants in Silicon," Journal of the Royal Statistical Society Series C, Royal Statistical Society, vol. 36(3), pages 352-357, November.
    • Handle: RePEc:bla:jorssc:v:36:y:1987:i:3:p:352-357
    DOI: 10.2307/2347794
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    Cited by:

    1. Bruno Feunou & Mohammad R. Jahan-Parvar & Roméo Tédongap, 2016. "Which parametric model for conditional skewness?," The European Journal of Finance, Taylor & Francis Journals, vol. 22(13), pages 1237-1271, October.
    2. Cheng, Ai-Ru & Jahan-Parvar, Mohammad R., 2014. "Risk–return trade-off in the pacific basin equity markets," Emerging Markets Review, Elsevier, vol. 18(C), pages 123-140.
    3. Kozubowski, Tomasz J. & Nolan, John P., 2008. "Infinite divisibility of skew Gaussian and Laplace laws," Statistics & Probability Letters, Elsevier, vol. 78(6), pages 654-660, April.
    4. Bruno Feunou & Ricardo Lopez Aliouchkin & Roméo Tedongap & Lai Xu, 2020. "The Term Structures of Loss and Gain Uncertainty," Staff Working Papers 20-19, Bank of Canada.

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