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Coexistence Paradigm of The Technological Catching Up Process

Author

Listed:
  • Jie Xiong
  • Lu Xu

    (CleRMa - Clermont Recherche Management - ESC Clermont-Ferrand - École Supérieure de Commerce (ESC) - Clermont-Ferrand - UCA - Université Clermont Auvergne)

  • Jie Yan
  • Shubho Chakraborty

    (ESC [Rennes] - ESC Rennes School of Business)

  • Yeming Gong

    (EM - EMLyon Business School)

Abstract

Established studies on catching up have mainly overlooked a comprehensive understanding of the process. We examine the Chinese auto parts manufacturing industry's technological catch-up to derive conclusions about the development paradigm. We address this conundrum by employing a process-based case study to extend the theory of technological catching up. This leads us to call this alternative paradigm coexistence. Coexistence encompasses various interactions between new and old generations in the process of catching up. In our findings, we propose three coexistence scenarios, namely: convergent, asymptotic, and intersectional.

Suggested Citation

  • Jie Xiong & Lu Xu & Jie Yan & Shubho Chakraborty & Yeming Gong, 2024. "Coexistence Paradigm of The Technological Catching Up Process," Post-Print hal-04042458, HAL.
    • Handle: RePEc:hal:journl:hal-04042458
    as

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