IDEAS home Printed from https://ideas.repec.org/h/spr/ssrchp/978-3-031-70288-4_18.html
   My bibliography  Save this book chapter

Statistical Design of New Two-Stage Plans for Reliability Demonstration Testing

In: Reliability Analysis and Maintenance Optimization of Complex Systems

Author

Listed:
  • Sun-Keun Seo

    (Dong-A University)

  • Won Young Yun

    (Pusan National University)

Abstract

Reliability demonstration tests (RDTs) to ensure a pre-specified reliability target with a stated confidence level are widely used in industry. A new two-stage RDT plan that is more efficient in terms of expected test duration and useful in practice than corresponding single-stage ones is proposed for Weibull and lognormal distributions, respectively. Accepting zero or one failure two-stage plans to minimize the expected test duration at various quality levels including a lifetime target are proposed and analyzed under Type I censoring and sample sizes designated. Numerical examples are studied to illustrate the proposed two-stage RDT plans.

Suggested Citation

  • Sun-Keun Seo & Won Young Yun, 2025. "Statistical Design of New Two-Stage Plans for Reliability Demonstration Testing," Springer Series in Reliability Engineering, in: Qian Qian Zhao & Il Han Chung & Junjun Zheng & Jongwoon Kim (ed.), Reliability Analysis and Maintenance Optimization of Complex Systems, pages 329-344, Springer.
    • Handle: RePEc:spr:ssrchp:978-3-031-70288-4_18
    DOI: 10.1007/978-3-031-70288-4_18
    as

    Download full text from publisher

    To our knowledge, this item is not available for download. To find whether it is available, there are three options:
    1. Check below whether another version of this item is available online.
    2. Check on the provider's web page whether it is in fact available.
    3. Perform a search for a similarly titled item that would be available.

    More about this item

    Statistics

    Access and download statistics

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:spr:ssrchp:978-3-031-70288-4_18. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Sonal Shukla or Springer Nature Abstracting and Indexing (email available below). General contact details of provider: http://www.springer.com .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.