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Imperfect Debugging, Testing Coverage, and Compiler Error-Based SRGM with Two Types of Faults Under the Uncertainty of the Operating Environment

In: Reliability Engineering for Industrial Processes

Author

Listed:
  • Sujit Kumar Pradhan

    (BITS Pilani K K Birla Goa Campus)

  • Anil Kumar

    (BITS Pilani K K Birla Goa Campus)

  • Vijay Kumar

    (Amity Institute of Applied Sciences, Amity University)

  • P. K. Kapur

    (Amity University)

Abstract

The familiar supposition for many software reliability growth models is that the software’s faults are independent and can be fixed ideally. However, this is not always valid due to several aspects like developers’ efficiency, software complexity, testing environment, etc. The testing environment greatly affects the software’s reliability after being implemented in the actual field environment. Therefore, the improvement of the software’s reliability is needed while the software works in the natural environment. In this chapter, under the uncertainty of the environment, we have presented a model in which two different testing coverage function and a time-dependent fault content function is incorporated. The central thought about the proposed model is that the natural testing time differs from the theoretical testing time. The existing models are compared with the proposed model using three different data sets on eight goodness-of-fit criteria. It is shown that the proposed model fits the data set better than the existing models.

Suggested Citation

  • Sujit Kumar Pradhan & Anil Kumar & Vijay Kumar & P. K. Kapur, 2024. "Imperfect Debugging, Testing Coverage, and Compiler Error-Based SRGM with Two Types of Faults Under the Uncertainty of the Operating Environment," Springer Series in Reliability Engineering, in: P. K. Kapur & Hoang Pham & Gurinder Singh & Vivek Kumar (ed.), Reliability Engineering for Industrial Processes, pages 361-380, Springer.
    • Handle: RePEc:spr:ssrchp:978-3-031-55048-5_22
    DOI: 10.1007/978-3-031-55048-5_22
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