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The Optimal Burn-in: State of the Art and New Advances for Cost Function Formulation

In: Recent Advances in Reliability and Quality in Design

Author

Listed:
  • Xin Liu

    (Delft University of Technology)

  • Thomas A. Mazzuchi

    (The George Washington University)

Abstract

Burn-in is a quality screening technique used to induce early failures that would be costly if experienced by the customer. As a method to screen out the earlier failures of the products, burn-in testing has been widely used in electronic manufacturing as well as many other areas such as the military and aerospace industries since the 1950s. Burn-in has proven to be a very effective quality control procedure which can improve products’ quality, enhance their reliability for operational life, and bring both profit and goodwill to the manufacturers.

Suggested Citation

  • Xin Liu & Thomas A. Mazzuchi, 2008. "The Optimal Burn-in: State of the Art and New Advances for Cost Function Formulation," Springer Series in Reliability Engineering, in: Hoang Pham (ed.), Recent Advances in Reliability and Quality in Design, chapter 6, pages 137-182, Springer.
    • Handle: RePEc:spr:ssrchp:978-1-84800-113-8_6
    DOI: 10.1007/978-1-84800-113-8_6
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    Citations

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    Cited by:

    1. Kim, Kyungmee O., 2011. "Burn-in considering yield loss and reliability gain for integrated circuits," European Journal of Operational Research, Elsevier, vol. 212(2), pages 337-344, July.
    2. Ye, Zhi-Sheng & Shen, Yan & Xie, Min, 2012. "Degradation-based burn-in with preventive maintenance," European Journal of Operational Research, Elsevier, vol. 221(2), pages 360-367.
    3. Safaei, Fatemeh & Taghipour, Sharareh, 2024. "Integrated degradation-based burn-in and maintenance model for heterogeneous and highly reliable items," Reliability Engineering and System Safety, Elsevier, vol. 244(C).

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