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Software Reliability Growth Models Based on Component Characteristics

In: Recent Advances in Reliability and Quality in Design

Author

Listed:
  • Takaji Fujiwara

    (Fujitsu Peripherals Limited)

  • Shinji Inoue

    (Tottori University)

  • Shigeru Yamada

    (Tottori University)

Abstract

It is one of the important issues in modern software development to make a highly reliable software system by efficient and economical testing. As one of these solutions, many companies have taken in testing-progress management and quality/reliability assessment based on software reliability growth models. Consequently, many software reliability growth models reflecting various development factors and operational environment of the software system have been proposed. Most of these models have assumed the software system as one domain. That is, the models have assumed that the set of the testing-paths influenced by execution of test-cases is extended with testing-progress and it expands to whole software system finally. However, a software system has the structure that the main-component calls plural sub-components ordinarily. Therefore, unless the main-component is tested, the sub-component called from it is not tested. In this chapter, we propose software reliability growth models based on such components' characteristics. Especially, these models reflecting the different testing-environment for composed components are formulated by nonhomogeneous Poisson processes. Furthermore, using fault-detection data observed in actual development projects, we show numerical examples of software reliability assessment and results of goodness-of-fit comparisons with existing software reliability growth models.

Suggested Citation

  • Takaji Fujiwara & Shinji Inoue & Shigeru Yamada, 2008. "Software Reliability Growth Models Based on Component Characteristics," Springer Series in Reliability Engineering, in: Hoang Pham (ed.), Recent Advances in Reliability and Quality in Design, chapter 16, pages 331-342, Springer.
  • Handle: RePEc:spr:ssrchp:978-1-84800-113-8_16
    DOI: 10.1007/978-1-84800-113-8_16
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