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Multivariate Statistical Process Monitoring Scheme with PLS and SVDD

In: Proceedings of 20th International Conference on Industrial Engineering and Engineering Management

Author

Listed:
  • Jia Liu

    (Automation Research and Design Institute of Metallurgical Industry)

  • Yan-guang Sun

    (Automation Research and Design Institute of Metallurgical Industry)

Abstract

In order to adaptably monitor product qualities during real industrial process, a new multivariate statistical process monitoring scheme combining projection to latent spaces (PLS) and Support Vector Domain Description (SVDD) is proposed. PLS can establish the monitoring space, which maximizes the correlation between process variables and quality variables and enable product qualities monitoring through process variables. SVDD can define the admissible domain by normal operation data without constraints about data distribution. Moreover, with kernel functions it can even provide a tight admissible domain for the operation data. Such characteristics make it suitable for practical production processes. This scheme is then applied to Tennessee Eastman process, and its efficiency for fault detection is proved by introducing simulated process faults. Analysis about its limits in fault detection is also presented.

Suggested Citation

  • Jia Liu & Yan-guang Sun, 2013. "Multivariate Statistical Process Monitoring Scheme with PLS and SVDD," Springer Books, in: Ershi Qi & Jiang Shen & Runliang Dou (ed.), Proceedings of 20th International Conference on Industrial Engineering and Engineering Management, edition 127, pages 57-70, Springer.
    • Handle: RePEc:spr:sprchp:978-3-642-40072-8_6
    DOI: 10.1007/978-3-642-40072-8_6
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