System Dependability and Analytics
Editor
- Long Wang(Tsinghua University)Karthik Pattabiraman(University of British Columbia)Catello Di Martino(Nokia Bell Labs)Arjun Athreya(Mayo Clinic)Saurabh Bagchi(Purdue University)
Abstract
No abstract is available for this item.Individual chapters are listed in the "Chapters" tab
Suggested Citation
- Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), 2023. "System Dependability and Analytics," Springer Series in Reliability Engineering, Springer, number 978-3-031-02063-6, July.
Handle: RePEc:spr:ssreng:978-3-031-02063-6
DOI: 10.1007/978-3-031-02063-6Download full text from publisher
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The following chapters of this book are listed in IDEAS- Long Wang, 2023. "Introduction: Software Dependability," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 3-5, Springer.
- Michael R. Lyu & Yuxin Su, 2023. "Intelligent Software Engineering for Reliable Cloud Operations," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 7-37, Springer.
- Robert Hanmer & Veena Mendiratta, 2023. "Data Analytics: Predicting Software Bugs in Industrial Products," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 39-53, Springer.
- Shuo Chen, 2023. "From Dependability to Security—A Path in the Trustworthy Computing Research," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 55-67, Springer.
- Keun Soo Yim, 2023. "Assessment of Security Defense of Native Programs Against Software Faults," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 69-98, Springer.
- Cuong Pham, 2023. "Multi-layered Monitoring for Virtual Machines," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 99-140, Springer.
- Saurabh Bagchi, 2023. "Security for Software on Tiny Devices," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 141-160, Springer.
- Saurabh Bagchi, 2023. "Introduction: Large-Scale Systems and Data Analytics," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 163-166, Springer.
- Zheyu Yan & Xiaobo Sharon Hu & Yiyu Shi, 2023. "On the Reliability of Computing-in-Memory Accelerators for Deep Neural Networks," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 167-190, Springer.
- Long Wang, 2023. "Providing Compliance in Critical Computing Systems," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 191-206, Springer.
- Karthik Pattabiraman, 2023. "Application-Aware Reliability and Security: The Trusted Illiac Experience," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 207-219, Springer.
- Marcello Cinque & Domenico Cotroneo & Antonio Pecchia, 2023. "Mining Dependability Properties from System Logs: What We Learned in the Last 40 Years," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 221-238, Springer.
- Luigi Coppolino & Salvatore D’Antonio & Giovanni Mazzeo & Luigi Romano, 2023. "Critical Infrastructure Protection: Where Convergence of Logical and Physical Security Technologies is a Must," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 239-254, Springer.
- Arjun P. Athreya, 2023. "Introduction: Cyber Physical Systems and Healthcare Analytics," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 257-258, Springer.
- Jie Wu & Jinjun Xiong & Yiyu Shi, 2023. "On Improving the Reliability of Power Grids for Multiple Power Line Outages and Anomaly Detection," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 259-300, Springer.
- Hui Lin, 2023. "Domain-Specific Security Approaches for Cyber-Physical Systems," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 301-322, Springer.
- Liewei Wang & Richard M. Weinshilboum, 2023. "Uniting Computational Science with Biomedicine: The NSF Center for Computational Biotechnology and Genomic Medicine (CCBGM)," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 323-325, Springer.
- Murthy V. Devarakonda, 2023. "Data-Driven Approaches to Selecting Samples for Training Neural Networks," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 327-345, Springer.
- Sayantani Basu & Roy H. Campbell, 2023. "Classifying COVID-19 Variants Based on Genetic Sequences Using Deep Learning Models," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 347-360, Springer.
- Gregory Worrell, 2023. "Twenty-First Century Cybernetics and Disorders of Brain and Mind," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 361-365, Springer.
- Karthik Pattabiraman, 2023. "Introduction: Dependability Assessment," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 369-370, Springer.
- Hiroyuki Okamura & Junjun Zheng & Tadashi Dohi & Kishor S. Trivedi, 2023. "Effect of Epistemic Uncertainty in Markovian Reliability Models," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 371-392, Springer.
- Mohamed Kaâniche & Karama Kanoun, 2023. "System Dependability Assessment—Interplay Between Research and Practice," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 393-404, Springer.
- Saurabh Jha, 2023. "Assessing Dependability of Autonomous Vehicles," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 405-421, Springer.
- Gene E. Robinson, 2023. "Foreword: Computing and Genomics at Illinois," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 425-427, Springer.
- Janak H. Patel, 2023. "An Academic Life Begins and Continues at University of Illinois at Urbana-Champaign," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 429-430, Springer.
- Wen-Mei Hwu, 2023. "Learning from Prof. Iyer," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 431-433, Springer.
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