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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

Author

Listed:
  • Cher Ming Tan

    (Nanyang Technological University)

  • Wei Li

    (Singapore Institute of Manufacturing)

  • Zhenghao Gan

    (Semiconductor Manufacturing)

  • Yuejin Hou

    (#10-226 BLK156)

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Suggested Citation

  • Cher Ming Tan & Wei Li & Zhenghao Gan & Yuejin Hou, 2011. "Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections," Springer Series in Reliability Engineering, Springer, edition 1, number 978-0-85729-310-7, July.
    • Handle: RePEc:spr:ssreng:978-0-85729-310-7
    DOI: 10.1007/978-0-85729-310-7
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