Author
Listed:
- R. CORTES
(Centro de Investigación Científica y de Educación Superior de Ensenada, CICESE, Unidad Monterrey, Alianza Sur 203, Autopista al Aeropuerto Km 10, Parque PIIT, Apodaca, N. L., C. P. 66600, México)
- V. COELLO
(Centro de Investigación Científica y de Educación Superior de Ensenada, CICESE, Unidad Monterrey, Alianza Sur 203, Autopista al Aeropuerto Km 10, Parque PIIT, Apodaca, N. L., C. P. 66600, México)
- P. SEGOVIA
(Doctorado en Ingeniería Física Industrial, Facultad de Ciencias Físico-Matemáticas, UANL, Pedro de Alba S/N Ciudad Universitaria, San Nicolás de los Garza, N. L., C. P. 66451, México)
- C. GARCÍA
(Doctorado en Ingeniería Física Industrial, Facultad de Ciencias Físico-Matemáticas, UANL, Pedro de Alba S/N Ciudad Universitaria, San Nicolás de los Garza, N. L., C. P. 66451, México)
- J. M. MERLO
(Tecnológico de Monterrey, Campus Puebla, Vía Atlixcayotl 2301, San Andrés Cholula, Puebla, C. P. 72800, México)
- J. F. AGUILAR
(Instituto Nacional de Astrofísica Óptica y Electrónica, Luis Enrique Erro No. 1, Sta. Ma. Tonantzintla, Puebla, C. P. 72800, México)
Abstract
We investigate experimentally the interference in far-field radiation of two contra-propagating evanescent fields using a conventional optical microscope. A laser beam illuminates a glass-air interface under total internal reflection condition and through the proper setup a double evanescent illumination was produced. The evanescent fields radiate from the surface into the far-field domain due to small surface scatterers. Thus, coherent interference is produced in the far-field region which is correlated with the relative positions of the evanescent illumination sources. Finally, the above-described could be considered as a device for high accuracy micro-scale measurements as well as a direct visualization method of evanescent phenomena.
Suggested Citation
R. Cortes & V. Coello & P. Segovia & C. García & J. M. Merlo & J. F. Aguilar, 2011.
"Interference In Far-Field Radiation Of Evanescent Fields,"
Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 18(06), pages 261-265.
Handle:
RePEc:wsi:srlxxx:v:18:y:2011:i:06:n:s0218625x11014746
DOI: 10.1142/S0218625X11014746
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