Author
Listed:
- KUI ZHOU
(Key Laboratory of Beam Technology and Material Modification of Ministry of Education, Institution of Low Energy Nuclear Physics, Beijing Normal University, Beijing Radiation Center, 100875 Beijing, China)
- XIANYING WU
(Key Laboratory of Beam Technology and Material Modification of Ministry of Education, Institution of Low Energy Nuclear Physics, Beijing Normal University, Beijing Radiation Center, 100875 Beijing, China)
- XU ZHANG
(Key Laboratory of Beam Technology and Material Modification of Ministry of Education, Institution of Low Energy Nuclear Physics, Beijing Normal University, Beijing Radiation Center, 100875 Beijing, China)
- LIZHAO QIN
(Key Laboratory of Beam Technology and Material Modification of Ministry of Education, Institution of Low Energy Nuclear Physics, Beijing Normal University, Beijing Radiation Center, 100875 Beijing, China)
- BIN LIAO
(Key Laboratory of Beam Technology and Material Modification of Ministry of Education, Institution of Low Energy Nuclear Physics, Beijing Normal University, Beijing Radiation Center, 100875 Beijing, China)
Abstract
Nanocompositenc-ZrCN/a-C:H(N)films were prepared by filtered cathodic vacuum arc technique using theC2H2andN2gas as the precursor. The effect of theC2H2andN2flow rate on the microstructure, internal stress, phase composition, and mechanical properties of nanocompositenc-ZrCN/a-C:H(N)films has been investigated by glancing incidence X-ray diffraction (GIXRD), surface profiler, and X-ray photoelectron spectroscopy(XPS). It was revealed that theC2H2andN2flow rate affected the structure,Zrcontent, and internal stress of the films significantly. Furthermore, XRD pattern indicated the presence of theZrCNcrystalline grains in the range of 3–10 nm, and the deconvolution results for XPS spectra showed that the film mainly was constituted byZr–C,C=C(sp2) andC–C(sp3) bonds.
Suggested Citation
Kui Zhou & Xianying Wu & Xu Zhang & Lizhao Qin & Bin Liao, 2008.
"EFFECT OF THEC2H2ANDN2FLOW RATE ON NANOCOMPOSITEnc-ZrCN/a-C:H(N)FILM SYNTHESIZED BY FILTERED CATHODIC VACUUM ARC TECHNIQUE,"
Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 15(06), pages 781-786.
Handle:
RePEc:wsi:srlxxx:v:15:y:2008:i:06:n:s0218625x08012207
DOI: 10.1142/S0218625X08012207
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