Author
Listed:
- M. S. DHLAMINI
(Department of Physics, University of Free State, P. O. Box 339, ZA-9300, Bloemfontein, Republic of South Africa)
- J. J. TERBLANS
(Department of Physics, University of Free State, P. O. Box 339, ZA-9300, Bloemfontein, Republic of South Africa)
- O. M. NTWAEABORWA
(Department of Physics, University of Free State, P. O. Box 339, ZA-9300, Bloemfontein, Republic of South Africa)
- H. C. SWART
(Department of Physics, University of Free State, P. O. Box 339, ZA-9300, Bloemfontein, Republic of South Africa)
Abstract
PbSnanoparticle phosphors embedded inSiO2were synthesized at room temperature by the sol–gel method. The as-preparedSiO2:0.134 mol%PbSnanoparticles were ground and annealed in atmosphere. Changes in the cathodoluminescence (CL) brightness and the surface chemical composition of theSiO2:0.134 mol%PbSnanoparticle powders were investigated using a Fiber Optics PC2000 spectrometer for CL and Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS) for the surface chemical analysis. The chemical composition of the powders was analyzed by an energy-dispersive spectrometer (EDS). The CL intensity decreased when the powders were irradiated with a beam of electrons at 2 keV energy and a beam current density of 54 mA/cm2in an ultra-high vacuum chamber at oxygen (O2) pressures ranging between5 × 10-8and2 × 10-7Torr for several hours. TheO2Auger peak-to-peak height (APPH) decreased as the CL intensity decreased. XPS analysis on the degraded spot showed the development of characteristicSiO,SiOx, and elementalSipeaks on the low-energy side of theSiO2peak. The desorption ofO2from the surface, which resulted in a decrease in the CL intensity is attributed to the dissociation ofSiO2into elementalSiandO2by the electron bombardment. The degradation was less severe at higher oxygen pressures.PbSO4was also formed on the surface during the electron beam degradation process.
Suggested Citation
M. S. Dhlamini & J. J. Terblans & O. M. Ntwaeaborwa & H. C. Swart, 2007.
"SYNTHESIS AND DEGRADATION OF THEPbSNANOPARTICLE PHOSPHORS EMBEDDED INSiO2(SiO2:PbS),"
Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 14(04), pages 697-701.
Handle:
RePEc:wsi:srlxxx:v:14:y:2007:i:04:n:s0218625x07009955
DOI: 10.1142/S0218625X07009955
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