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IMAGING 0.4 nm SINGLE-WALLED CARBON NANOTUBES WITH ATOMIC FORCE MICROSCOPY

Author

Listed:
  • XIEQIU ZHANG

    (Department of Physics and Institute of Nano Science and Technology, Hong Kong University of Science and Technology, Hong Kong, China)

  • JIANTING YE

    (Department of Physics and Institute of Nano Science and Technology, Hong Kong University of Science and Technology, Hong Kong, China)

  • HONGWEI YANG

    (Department of Physics and Institute of Nano Science and Technology, Hong Kong University of Science and Technology, Hong Kong, China)

  • CHUN ZHANG

    (Department of Physics and Institute of Nano Science and Technology, Hong Kong University of Science and Technology, Hong Kong, China)

  • KIN MING HO

    (Department of Physics and Institute of Nano Science and Technology, Hong Kong University of Science and Technology, Hong Kong, China)

  • TAO SU

    (Department of Physics and Institute of Nano Science and Technology, Hong Kong University of Science and Technology, Hong Kong, China)

  • NING WANG

    (Department of Physics and Institute of Nano Science and Technology, Hong Kong University of Science and Technology, Hong Kong, China)

  • ZIKANG TANG

    (Department of Physics and Institute of Nano Science and Technology, Hong Kong University of Science and Technology, Hong Kong, China)

  • XUDONG XIAO

    (Department of Physics and Institute of Nano Science and Technology, Hong Kong University of Science and Technology, Hong Kong, China)

Abstract

The discovery of the single-walled carbon nanotubes (SWCNTs) with a diameter of 0.4 nm has attracted extensive attentions. In this paper we report our attempt with two methods to directly observe these SWCNTs by AFM. The first one is to deposit the SWCNTs extracted from the zeolite matrix to a flat surface for AFM observation. While one-dimensional features have been observed, the SWCNT was suspected not to adhere well to the substrate. To overcome the difficulties of weak adhesion, we attempt to expose only part of the SWCNT from the zeolite channel by cutting the zeolite crystal at an angle. This alternative method, in which the SWCNT contained zeolite crystal is polished and etched by HCl, however, did not result in a smooth enough surface and thus no one-dimensional features can be observed. The difficulties in sample preparation and possible improvements are discussed.

Suggested Citation

  • Xieqiu Zhang & Jianting Ye & Hongwei Yang & Chun Zhang & Kin Ming Ho & Tao Su & Ning Wang & Zikang Tang & Xudong Xiao, 2007. "IMAGING 0.4 nm SINGLE-WALLED CARBON NANOTUBES WITH ATOMIC FORCE MICROSCOPY," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 14(04), pages 687-692.
    • Handle: RePEc:wsi:srlxxx:v:14:y:2007:i:04:n:s0218625x07009931
    DOI: 10.1142/S0218625X07009931
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