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Near-Field Scanning Optical Microscope With The Application Of Surface Plasma Resonance (Spr)

Author

Listed:
  • TIANHAO ZHANG

    (Photonics Research Center, The MOE Key Lab of Advanced Technique and Fabrication for Weak-Light Nonlinear Photonics Materials and Tianjin Key Lab of Photonics, Materials and Technology for Information Science, Nankai University, Tianjin 300457, P. R. China)

  • ZHEYU FANG

    (Photonics Research Center, The MOE Key Lab of Advanced Technique and Fabrication for Weak-Light Nonlinear Photonics Materials and Tianjin Key Lab of Photonics, Materials and Technology for Information Science, Nankai University, Tianjin 300457, P. R. China)

  • JIANYA ZHENG

    (Photonics Research Center, The MOE Key Lab of Advanced Technique and Fabrication for Weak-Light Nonlinear Photonics Materials and Tianjin Key Lab of Photonics, Materials and Technology for Information Science, Nankai University, Tianjin 300457, P. R. China)

  • LIMO GAO

    (Photonics Research Center, The MOE Key Lab of Advanced Technique and Fabrication for Weak-Light Nonlinear Photonics Materials and Tianjin Key Lab of Photonics, Materials and Technology for Information Science, Nankai University, Tianjin 300457, P. R. China)

  • MEIRONG YIN

    (Photonics Research Center, The MOE Key Lab of Advanced Technique and Fabrication for Weak-Light Nonlinear Photonics Materials and Tianjin Key Lab of Photonics, Materials and Technology for Information Science, Nankai University, Tianjin 300457, P. R. China)

  • XUE WU

    (Photonics Research Center, The MOE Key Lab of Advanced Technique and Fabrication for Weak-Light Nonlinear Photonics Materials and Tianjin Key Lab of Photonics, Materials and Technology for Information Science, Nankai University, Tianjin 300457, P. R. China)

  • FENG JIA

    (Photonics Research Center, The MOE Key Lab of Advanced Technique and Fabrication for Weak-Light Nonlinear Photonics Materials and Tianjin Key Lab of Photonics, Materials and Technology for Information Science, Nankai University, Tianjin 300457, P. R. China)

Abstract

The NSOM based on surface plasma resonance (SPR) technique is established. A new Kretschmann type of SPR is designed. The plasma with a gradient of thickness is fabricated using prism covered by gold film. The curve of SPR depending on the angle of incident beam is measured. The image of gold film on plasma is obtained at the SPR situation using this NSOM based on SPR technique. The experimental result indicates that the signal intensity, S/N ratio, and the resolution for NSOM are greatly improved based on this type of technique.

Suggested Citation

  • Tianhao Zhang & Zheyu Fang & Jianya Zheng & Limo Gao & Meirong Yin & Xue Wu & Feng Jia, 2005. "Near-Field Scanning Optical Microscope With The Application Of Surface Plasma Resonance (Spr)," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 12(04), pages 489-492.
    • Handle: RePEc:wsi:srlxxx:v:12:y:2005:i:04:n:s0218625x05007311
    DOI: 10.1142/S0218625X05007311
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