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POLARIZATION DEPENDENCE OF RESONANT SOFT X-RAY EMISSION SPECTRA IN CeCOMPOUNDS

Author

Listed:
  • M. WATANABE

    (RIKEN/SPring-8, Kouto 1-1-1, Mikazuki, Sayo, Hyogo 679-5148, Japan)

  • Y. HARADA

    (RIKEN/SPring-8, Kouto 1-1-1, Mikazuki, Sayo, Hyogo 679-5148, Japan)

  • M. NAKAZAWA

    (JASRI/SPring-8, Kouto 1-1-1, Mikazuki, Sayo, Hyogo 679-5198, Japan)

  • Y. ISHIWATA

    (The Institute for Solid State Physics, University of Tokyo, Kashiwanoha, Kashiwa, Chiba 277-8581, Japan)

  • R. EGUCHI

    (The Institute for Solid State Physics, University of Tokyo, Kashiwanoha, Kashiwa, Chiba 277-8581, Japan)

  • T. TAKEUCHI

    (Faculty of Science, Science University of Tokyo, Kagurazaka, Shinjuku, Tokyo 162-8601, Japan)

  • A. KOTANI

    (The Institute for Solid State Physics, University of Tokyo, Kashiwanoha, Kashiwa, Chiba 277-8581, Japan)

  • S. SHIN

    (The Institute for Solid State Physics, University of Tokyo, Kashiwanoha, Kashiwa, Chiba 277-8581, Japan;
    RIKEN/SPring-8, Kouto 1-1-1, Mikazuki, Sayo, Hyogo 679-5148, Japan)

Abstract

The electronic structures of Ce compounds have been investigated by means of resonant soft X-ray emission spectroscopy (RXES) excited at resonant energy range of Ce3d → 4fabsorption. Polarization dependence of the RXES shows information on concerning electronic states. InCeO2, the Ce4f → 3dRXES spectra are interpreted as electronic structures hybridized between4f0and$4f^1 \underline{v}$states. Peaks appearing in the spectra are attributed to bonding, nonbonding, and antibonding states between those states, while the spectra ofCeRh3cannot be explained by only using the hybridization between4f0and$4f^1 \underline{v}$states. The spectra have large broad Raman peak, especially when the excitation photon energy is set at satellite of Ce3d → 4fabsorption. We attribute the origin of the broad Raman peak to hybridization states involving electron–hole pairs.

Suggested Citation

  • M. Watanabe & Y. Harada & M. Nakazawa & Y. Ishiwata & R. Eguchi & T. Takeuchi & A. Kotani & S. Shin, 2002. "POLARIZATION DEPENDENCE OF RESONANT SOFT X-RAY EMISSION SPECTRA IN CeCOMPOUNDS," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 9(02), pages 983-987.
    • Handle: RePEc:wsi:srlxxx:v:09:y:2002:i:02:n:s0218625x02003184
    DOI: 10.1142/S0218625X02003184
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