Author
Listed:
- T. GREBER
(Physik-Institut, Universität Zürich, Winterthurerstrasse 190, CH-8057 Zürich, Switzerland)
- W. AUWÄRTER
(Physik-Institut, Universität Zürich, Winterthurerstrasse 190, CH-8057 Zürich, Switzerland)
- M. HOESCH
(Physik-Institut, Universität Zürich, Winterthurerstrasse 190, CH-8057 Zürich, Switzerland)
- G. GRAD
(Physik-Institut, Universität Zürich, Winterthurerstrasse 190, CH-8057 Zürich, Switzerland;
Institute of Physical and Theoretical Chemistry, TU Vienna, Getreidemarkt 9/156, A-1060 Vienna, Austria)
- P. BLAHA
(Physik-Institut, Universität Zürich, Winterthurerstrasse 190, CH-8057 Zürich, Switzerland;
Institute of Physical and Theoretical Chemistry, TU Vienna, Getreidemarkt 9/156, A-1060 Vienna, Austria)
- J. OSTERWALDER
(Physik-Institut, Universität Zürich, Winterthurerstrasse 190, CH-8057 Zürich, Switzerland)
Abstract
Nickel (111) and the interface of hexagonal boron nitride on Ni(111) serve as model systems for an itinerant ferromagnet that is truncated with vacuum or a single layer insulator. These systems are investigated with angle-scanned He I and He II photoemission. Upon formation of theh-BN/Ni(111) interface the work function drops by 1.8 eV and the minority NiΛ3d-band shifts by 0.13 eV to higher binding energy. This indicates that the Ni magnetic moment decreases in the interface. Spin-polarized band structure calculations from bulk nickel identify the observed minority and majority bands. The experimental Fermi surface maps show thath-BN distorts a minorityd-band in a way which is consistent with the decreasing magnetic moment. It can be seen thath-BN affects the scattering of the electrons. Effects in the photoemission final and initial state are recognized.
Suggested Citation
T. Greber & W. Auwärter & M. Hoesch & G. Grad & P. Blaha & J. Osterwalder, 2002.
"The Fermi Surface In A Magnetic Metal–Insulator Interface,"
Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 9(02), pages 1243-1250.
Handle:
RePEc:wsi:srlxxx:v:09:y:2002:i:02:n:s0218625x02001884
DOI: 10.1142/S0218625X02001884
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