Author
Listed:
- H. TAKENAKA
(NTT Advanced Technology Co., Toukai, Ibaraki 319-1193, Japan)
- K. NAGAI
(NTT Advanced Technology Co., Toukai, Ibaraki 319-1193, Japan)
- H. ITO
(NTT Advanced Technology Co., Toukai, Ibaraki 319-1193, Japan)
- S. ICHIMARU
(NTT Advanced Technology Co., Toukai, Ibaraki 319-1193, Japan)
- T. SAKUMA
(Tokyo Gakugei University, Koganei, Tokyo, 184-8501, Japan)
- K. NAMIKAWA
(Tokyo Gakugei University, Koganei, Tokyo, 184-8501, Japan)
- Y. MURAMATSU
(Japan Atomic Energy Research Institute, Mikazuki, Hyogo 679-5198, Japan)
- E. GULLIKSON
(Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA)
- C. C. PERERA
(Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA)
Abstract
The development of highly reflective multilayer mirrors for use in the wavelength region around 6 nm is desired for X-ray photoemission spectroscopy for inner-shell excitation using a Schwarzschild objective. For this application, reflectivity is the most critical parameter determining the performance of multilayer mirrors, because the reflectivity of multilayers in the 6 nm region is generally very low. We have designed CoCr/C multilayer mirrors with a comparatively high reflectivity at around normal incidence and have fabricated them by magnetron sputtering. The measured peak reflectivity is about 16% at a wavelength of around 6 nm and an incident angle of 88°. The reflectivity remains almost constant for 4 h under 300°C in an Ar atmosphere.
Suggested Citation
H. Takenaka & K. Nagai & H. Ito & S. Ichimaru & T. Sakuma & K. Namikawa & Y. Muramatsu & E. Gullikson & C. C. Perera, 2002.
"SOFT X-RAY REFLECTIVITY AND THERMAL STABILITY OF CoCr/C MULTILAYER X-RAY MIRRORS,"
Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 9(01), pages 593-596.
Handle:
RePEc:wsi:srlxxx:v:09:y:2002:i:01:n:s0218625x02002701
DOI: 10.1142/S0218625X02002701
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