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A Free Electron Laser–Photoemission Electron Microscope System (FEL–PEEM)

Author

Listed:
  • H. Ade

    (Department of Physics and NCSU, Raleigh, NC 27695, USA)

  • W. Yang

    (Department of Physics and NCSU, Raleigh, NC 27695, USA)

  • S. L. English

    (Department of Engineering, NCSU, Raleigh, NC 27695, USA)

  • J. Hartman

    (Department of Engineering, NCSU, Raleigh, NC 27695, USA)

  • R. F. Davis

    (Department of Engineering, NCSU, Raleigh, NC 27695, USA)

  • R. J. Nemanich

    (Department of Physics and NCSU, Raleigh, NC 27695, USA)

  • V. N. Litvinenko

    (FEL Laboratory, Department of Physics, Duke University, Durham, NC 27708, USA)

  • I. V. Pinayev

    (FEL Laboratory, Department of Physics, Duke University, Durham, NC 27708, USA)

  • Y. Wu

    (FEL Laboratory, Department of Physics, Duke University, Durham, NC 27708, USA)

  • J. M. J. Madey

    (FEL Laboratory, Department of Physics, Duke University, Durham, NC 27708, USA)

Abstract

We report first results from our effort to couple a high resolution photoemission electron microscope (PEEM) to the OK-4 ultraviolet free electron laser at Duke University (OK-4/Duke UV FEL). The OK-4/Duke UV FEL is a high intensity source of tunable monochromatic photons in the 3–10 eV energy range. This tunability is unique and allows us to operate near the photoemission threshold of any samples and thus maximize sample contrast while keeping chromatic berrations in the PEEM minimal. We have recorded first images from a variety of samples using spontaneous radiation from the OK-4/ Duke UV FEL in the photon energy range of 4.0–6.5 eV. Due to different photothreshold emission from different sample areas, emission from these areas could be turned on (or off) selectively. We have also observed relative intensity reversal with changes in photon energy which are interpreted as density-of-state contrast. Usable image quality has been achieved, even though the output power of the FEL in spontaneous emission mode was several orders of magnitude lower than the anticipated full laser power. The PEEM has achieved a spatial resolution of 12 nm.

Suggested Citation

  • H. Ade & W. Yang & S. L. English & J. Hartman & R. F. Davis & R. J. Nemanich & V. N. Litvinenko & I. V. Pinayev & Y. Wu & J. M. J. Madey, 1998. "A Free Electron Laser–Photoemission Electron Microscope System (FEL–PEEM)," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 5(06), pages 1257-1268.
    • Handle: RePEc:wsi:srlxxx:v:05:y:1998:i:06:n:s0218625x98001596
    DOI: 10.1142/S0218625X98001596
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