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The Overlayer Structure on the Si(001)-(2×3)-AgSurface Determined by X-ray Photoelectron Diffraction

Author

Listed:
  • M. Shimomura

    (Research Institute for Scientific Measurements, Tohoku University, Sendai 980-8577, Japan)

  • T. Abukawa

    (Research Institute for Scientific Measurements, Tohoku University, Sendai 980-8577, Japan)

  • M. Higa

    (Research Institute for Scientific Measurements, Tohoku University, Sendai 980-8577, Japan)

  • M. Nakamura

    (Research Institute for Scientific Measurements, Tohoku University, Sendai 980-8577, Japan)

  • S. M. Shivaprasad

    (Research Institute for Scientific Measurements, Tohoku University, Sendai 980-8577, Japan)

  • H. W. Yeom

    (Research Institute for Scientific Measurements, Tohoku University, Sendai 980-8577, Japan;
    Department of Physics, Tohoku University, Sendai 980-8577, Japan)

  • S. Suzuki

    (Research Institute for Scientific Measurements, Tohoku University, Sendai 980-8577, Japan;
    Department of Physics, Tohoku University, Sendai 980-8577, Japan)

  • S. Sato

    (Research Institute for Scientific Measurements, Tohoku University, Sendai 980-8577, Japan;
    Department of Physics, Tohoku University, Sendai 980-8577, Japan)

  • J. Tani

    (Research Institute for Scientific Measurements, Tohoku University, Sendai 980-8577, Japan;
    Institute for Fluid Science, Tohoku University, Sendai 980-8577, Japan)

  • S. Kono

    (Research Institute for Scientific Measurements, Tohoku University, Sendai 980-8577, Japan)

Abstract

X-ray photoelectron diffraction (XPD) patterns of Ag 3d electrons from a single domain Si(001)-(2×3)-Ag surface were examined. Single scattering cluster and multiple scattering cluster simulations of the Ag 3d XPD patterns indicate an overlayer that contains four Ag atoms aligned almost linearly along the threefold direction in the unit cell on the Si(001) surface. The four-Ag-atom arrangement is discussed in the light of other information obtained by STM, LEEM and photoemission studies, finding it very feasible.

Suggested Citation

  • M. Shimomura & T. Abukawa & M. Higa & M. Nakamura & S. M. Shivaprasad & H. W. Yeom & S. Suzuki & S. Sato & J. Tani & S. Kono, 1998. "The Overlayer Structure on the Si(001)-(2×3)-AgSurface Determined by X-ray Photoelectron Diffraction," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 5(05), pages 953-958.
    • Handle: RePEc:wsi:srlxxx:v:05:y:1998:i:05:n:s0218625x98001286
    DOI: 10.1142/S0218625X98001286
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