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Enhancement of near-field subwavelength focusing using a solid immersion Fresnel zone plate with radially polarized incidence

Author

Listed:
  • Yaoju Zhang

    (School of Electronic and Communication Engineering, Quanzhou University of Information Engineering, Quanzhou 362000, P. R. China)

  • Qiong Yu

    (School of Electronic and Communication Engineering, Quanzhou University of Information Engineering, Quanzhou 362000, P. R. China)

  • Xinyi Chen

    (School of Electronic and Communication Engineering, Quanzhou University of Information Engineering, Quanzhou 362000, P. R. China)

  • Bo Zhang

    (School of Electronic and Communication Engineering, Quanzhou University of Information Engineering, Quanzhou 362000, P. R. China)

Abstract

A solid immersion Fresnel zone plate (SI-FZP) is designed, and its near-field diffraction characteristics are analyzed using the vector angular spectrum (VAS) method. The analytical VAS model of formulism for the electric field vector transmitted from a binary amplitude and/or phase circular SI-FZP is obtained for any polarization of incidence. Numerical calculations show that, when the solid film immersing a high-numerical-aperture FZP is truncated close to the FZP’s focus in a single homogeneous medium, the focusing intensity in the vicinity of the SI-FZP–air interface can be improved dozens of times in magnitude for radially polarized incidence, compared with the FZP’s far-field focusing in the single medium without an interface. The validity of the proposed analytical VAS model of formulism to analyze SI-FZP’s diffraction problems has been affirmed by comparison with numerical results obtained by the finite-difference time-domain simulation.

Suggested Citation

  • Yaoju Zhang & Qiong Yu & Xinyi Chen & Bo Zhang, 2022. "Enhancement of near-field subwavelength focusing using a solid immersion Fresnel zone plate with radially polarized incidence," International Journal of Modern Physics C (IJMPC), World Scientific Publishing Co. Pte. Ltd., vol. 33(07), pages 1-13, July.
    • Handle: RePEc:wsi:ijmpcx:v:33:y:2022:i:07:n:s0129183122500887
    DOI: 10.1142/S0129183122500887
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