IDEAS home Printed from https://ideas.repec.org/a/wsi/ijmpcx/v28y2017i12ns0129183117501315.html
   My bibliography  Save this article

The phosphorene under the external electronic field and strain

Author

Listed:
  • Tao Wang

    (College of Electrical Engineering, Department of Radiology, Second Affiliated Hospital, Zhejiang University, Hangzhou 310027, P. R. China)

  • Yan Liu

    (College of Electrical Engineering, Department of Radiology, Second Affiliated Hospital, Zhejiang University, Hangzhou 310027, P. R. China)

  • Wen Wen

    (College of Electrical Engineering, Department of Radiology, Second Affiliated Hospital, Zhejiang University, Hangzhou 310027, P. R. China)

  • Wei Guo

    (College of Electrical Engineering, Department of Radiology, Second Affiliated Hospital, Zhejiang University, Hangzhou 310027, P. R. China)

  • You Yin

    (Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin, Kiryu, Gunma 3768515, Japan)

Abstract

Using the ab initio plane-wave ultrasoft pseudopotential method based on the generalized gradient approximation (GGA), we investigate the bandgap tuning in monolayer phosphorene in terms of applying external electric fields perpendicular to the layers. The bandgap continuously decreases with the applied electric fields, eventually rendering them metallic. The phenomenon is explained by the giant stark effect. The interlayer P-P distance also result in the semiconductor-to-metal transition. The phosphorene exhibits the significant bandgap tuning ability under different strains with 5% variation. Our investigations show the bandgap change for the fabrication of novel electronic and photonic devices.

Suggested Citation

  • Tao Wang & Yan Liu & Wen Wen & Wei Guo & You Yin, 2017. "The phosphorene under the external electronic field and strain," International Journal of Modern Physics C (IJMPC), World Scientific Publishing Co. Pte. Ltd., vol. 28(12), pages 1-11, December.
    • Handle: RePEc:wsi:ijmpcx:v:28:y:2017:i:12:n:s0129183117501315
    DOI: 10.1142/S0129183117501315
    as

    Download full text from publisher

    File URL: http://www.worldscientific.com/doi/abs/10.1142/S0129183117501315
    Download Restriction: Access to full text is restricted to subscribers
    File URL: https://libkey.io/10.1142/S0129183117501315?utm_source=ideas
    LibKey link: if access is restricted and if your library uses this service, LibKey will redirect you to where you can use your library subscription to access this item
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:wsi:ijmpcx:v:28:y:2017:i:12:n:s0129183117501315. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Tai Tone Lim (email available below). General contact details of provider: http://www.worldscinet.com/ijmpc/ijmpc.shtml .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.