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Electrokinetic Slip Flow Of Microfluidics In Terms Of Streaming Potential By A Lattice Boltzmann Method: A Bottom-Up Approach

Author

Listed:
  • XIN FU

    (National Key Laboratory of Transient Physics, Nanjing University of Science and Technology, Nanjing, 210094, China)

  • BAOMING LI

    (National Key Laboratory of Transient Physics, Nanjing University of Science and Technology, Nanjing, 210094, China)

  • JUNFENG ZHANG

    (Department of Biomedical Engineering, School of Medicine, Johns Hopkins University, Baltimore, MD 21205, USA)

  • FUZHI TIAN

    (Nanotechnology and Engineering Laboratory, Department of Mechanical Engineering, Schulich School of Engineering, University of Calgary, Calgary, Alberta T2N 1N4, Canada)

  • DANIEL Y. KWOK

    (Nanotechnology and Engineering Laboratory, Department of Mechanical Engineering, Schulich School of Engineering, University of Calgary, Calgary, Alberta T2N 1N4, Canada)

Abstract

In traditional computational fluid dynamics, the effect of surface energetics on fluid flow is often ignored or translated into an arbitrary selected slip boundary condition in solving the Navier-Stokes equation. Using a bottom-up approach, we show in this paper that variation of surface energetics through intermolecular theory can be employed in a lattice Boltzmann method to investigate both slip and non-slip phenomena in microfluidics in conjunction with the description of electrokinetic phenomena for electrokinetic slip flow. Rather than using the conventional Navier-Stokes equation with a slip boundary condition, the description of electrokinetic slip flow in microfluidics is manifested by the more physical solid-liquid energy parameters, electrical double layer and contact angle in the mean-field description of the lattice Boltzmann method.

Suggested Citation

  • Xin Fu & Baoming Li & Junfeng Zhang & Fuzhi Tian & Daniel Y. Kwok, 2007. "Electrokinetic Slip Flow Of Microfluidics In Terms Of Streaming Potential By A Lattice Boltzmann Method: A Bottom-Up Approach," International Journal of Modern Physics C (IJMPC), World Scientific Publishing Co. Pte. Ltd., vol. 18(04), pages 693-700.
    • Handle: RePEc:wsi:ijmpcx:v:18:y:2007:i:04:n:s0129183107010954
    DOI: 10.1142/S0129183107010954
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