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A Simple Solid-On-Solid Model Of Epitaxial Film Growth: Surface Morphology Anisotropy

Author

Listed:
  • K. MALARZ

    (Department of Theoretical and Computational Physics, Faculty of Physics and Nuclear Techniques, University of Mining and Metallurgy (AGH), al. Mickiewicza 30, PL-30059 Kraków, Poland)

  • A. Z. MAKSYMOWICZ

    (Department of Theoretical and Computational Physics, Faculty of Physics and Nuclear Techniques, University of Mining and Metallurgy (AGH), al. Mickiewicza 30, PL-30059 Kraków, Poland)

Abstract

In this paper we present a generalization of a simple solid-on-solid epitaxial model of thin film growth, when surface morphology anisotropy is provoked by anisotropy in the model control parameters of binding energy and/or diffusion barrier. The anisotropy is discussed in terms of the height–height correlation function. It was experimentally confirmed that the difference in diffusion barriers yields anisotropy in morphology of the surface. We obtained antisymmetric correlations in the two in-plane directions for antisymmetric binding.

Suggested Citation

  • K. Malarz & A. Z. Maksymowicz, 1999. "A Simple Solid-On-Solid Model Of Epitaxial Film Growth: Surface Morphology Anisotropy," International Journal of Modern Physics C (IJMPC), World Scientific Publishing Co. Pte. Ltd., vol. 10(04), pages 659-665.
    • Handle: RePEc:wsi:ijmpcx:v:10:y:1999:i:04:n:s0129183199000498
    DOI: 10.1142/S0129183199000498
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